Bright luminescence from erbium doped nc-Si=SiO2 superlattices

نویسندگان

  • M. Schmidt
  • J. Heitmann
  • R. Scholz
  • M. Zacharias
چکیده

Optical properties of Er doped Si=SiO2 superlattices and SiO=SiO2 superlattices are compared. In the case of Si=SiO2 superlattices with Si layers thicknesses between 2 and 19 nm polycrystalline like Si layers are observed after annealing. The samples show a very weak defect related red room temperature luminescence. No significant enhancement of the Er luminescence could be shown. The SiO=SiO2 superlattices show after annealing the evidence of separated Si nanocrystals and a very strong red room temperature luminescence. The emission wavelength varies between 750 and 850 nm depending on the SiO layer thickness. In this case, a strong enhancement of the Er3þ luminescence by more than one order of magnitude was observed. Temperature dependent photoluminescence (PL) measurements of the 1:54 lm Er3þ luminescence are included. 2002 Elsevier Science B.V. All rights reserved. PACS: 78.55.)m; 61.72.Tt; 61.46.þw

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Exciton–erbium interactions in Si nanocrystal-doped SiO2

The presence of silicon nanocrystals in Er doped SiO2 can enhance the effective Er optical absorption cross section by several orders of magnitude due to a strong coupling between quantum confined excitons and Er. This article studies the fundamental processes that determine the potential of Si nanocrystals as sensitizers for use in Er doped waveguide amplifiers or lasers. Silicon nanocrystals ...

متن کامل

Strong exciton-erbium coupling in Si nanocrystal-doped SiO2

Silicon nanocrystals were formed in SiO2 using Si ion implantation followed by thermal annealing. The nanocrystal-doped SiO2 layer was implanted with Er to a peak concentration of 1.8 at. %. Upon 458 nm excitation the sample shows a broad nanocrystal-related luminescence spectrum centered around 750 nm and two sharp Er luminescence lines at 982 and 1536 nm. By measuring the excitation spectra o...

متن کامل

Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering

We have fabricated a series of thin (~50 nm) erbium-doped (by ion implantation) silicon-rich oxide films in the configuration that mitigates previously proposed mechanisms for loss of light emission capability of erbium ions. By combining the methods of optical, structural and electrical analysis, we identify the erbium ion clustering as a driving mechanism to low optical performance of this ma...

متن کامل

Excitons in Si nanocrystals: Confinement and migration effects

A detailed analysis of the strong room-temperature photoluminescence ~PL! signal of size controlled nc-Si is reported. The size control of nc-Si is realized by evaporation of SiO/SiO2 superlattices and subsequent thermally induced phase separation. By this method the synthesis of completely SiO2 passivated Si nanocrystals with a controlled size is demonstrated. A strong blueshift of the photolu...

متن کامل

Synthesis and Size-control of Si Nanocrystals by SiO/SiO2 Superlattices

After first investigations on the room temperature photoluminescence (PL) signal of porous Si [1,2], interest in the optical properties of semiconductor nanoparticles, especially porous Si and Si nanoparticles, has grown over the last decade [3,4]. Different processes for the synthesis of nanocrystalline Si (nc-Si) like Si ion implantation into high quality oxides [3], sputtering of Si-rich oxi...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2002